X-ray Detector Calibration Analysis System And The Operating Characteristics Of The Space Particle Detector, Semiconductor Sensor Detection System | | Posted on:2004-07-05 | Degree:Master | Type:Thesis | | Country:China | Candidate:F Wei | Full Text:PDF | | GTID:2190360092999541 | Subject:Space physics | | Abstract/Summary: | | | As expansion of human beings' activities among space areas, it has become an important part of astronautics to find out the space environment, exploit the space environment and secure spacecrafts. Space Environment Explorers based on the sky are significant tools that help to explore the outer space and secure astronautic activities. Monitoring space charge particles and X ray is the most important task for space environment exploring.Space explorers for charge-particles detecting and those for solar X-ray detecting are kernels of space environment monitoring systems for space charge-particles monitoring and space soft,hard X-ray monitoring respectively. The performance and accuracy of these kinds of explorers are definitive factors that influence the performance and accuracy of relevant space environment monitoring systems so much. In order to make the exploring ability of space environment monitoring systems progress, it is very pivotal to improve the performance of explorers. The Scaling and Analyzing System (SAS) for general X-ray detecting explorers discussed in this paper is developed to meet the purpose of analog signal quantifying for some different types of explorers. It is constituted of a pulse-peek sampling and ADC module, a bulk data transfer module and relevant software. The pulse-peek sampling and ADC module is able to catch a single and very narrow pulse in order to sample its peek value without being influenced by other pulses or noise. The pulse-peek sampling and ADC module can also adapt itself to different rising edge of pulses, so it can scale different types of explorers made by our research institute. The bulk data transfer module is based on USB (Universal Serial Bus) technology. Its speed is much faster than that of serial port, and devices based on USB tie up much fewer hardware I/O address resources than PCI devices do. Due to its characteristic of Plug & Play (PNP), the bulk data transfer module has great advantage and potential to be applied to data transferring between mobile devices, such as notebooks, which don't allow users to plug their own PCI devices directly in. In this paper, we also discussed and build a mathematic model to correct the non-linear warp of signal during the process of sampling and transferring.Semiconductor sensors have been widely used in tasks of space environmentexploration because of their small bulk, light weight, high measurement precision and wide applicability in various detecting occasions. Whether a semiconductor sensor used in a monitoring system can work stably and reliably or not will directly determine the whole performance of the system. So it is valuable to measure every sensor strictly and accurately before they are used. Chinese scientists began to research space environment exploration methods with semiconductor sensors in the mid 1990s. But in the past years, we only examined semiconductor sensors by handwork. Usually it took months to examine a limited quantity of semiconductor sensors with day and night each time, and also it was a burdensome job. With the rapid development of the space enterprise of our country, it demands much larger quantity and higher quality on producing semiconductor sensors. It is very necessary to develop new methods for semiconductor sensors examination. The Noise Measurement and Analysis System for Semiconductor Sensors (NMASSS) on working can automatically detect weak noise signal of up to 32 sensors at the same time. It is able to keep working and saving data continuously for more than 90 days, catch and analyze each abnormal phenomenon. This system will help greatly to develop the reliance on space systems, both commercial and military. | | Keywords/Search Tags: | Space Charge-particles, Explorers, X-ray, Scaling and Analyzing, USB, Semiconductor Sensors, Working Peculiarity | | Related items |
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