The Application Of Atomic Force Microscope In Imaging Of Materials And Optical Storage

Since 1986, atomic force microscope has become important tool to explore the microworld, which not only makes it possible for people observing the nano-particles, but also manipulating the nano-particles. In this paper, the structure and principle of atomic force microscope as well as the study on the properties of carbon nano-coil, ZnO films and ultra-high density optical storage have been introduced.Because of the special structure, carbon nano-coil not only carries on the excellent conductivity and mechanic strength of carbon nano-tube, but also possesses good electromagnetic properties. Thus carbon nano-coils gain a great value in the field of micro-electromechanical device. Atomic force microscope has been used to investigate the characteristic of single carbon nano-coil in this paper.As a type of optoelectronic materials, ZnO has been applied to the fields of transparent electrodes, piezoelectric devices, UV activated emission device widely. ZnO films growing on Si(111) substrates with homogeneous buffer layers (ZnO) is one method to obtain the high quality films. In this paper, atomic force microscope, X ray diffraction, Raman spectroscopy and photoluminescence spectrum are used to study the influence of ZnO buffer depositing temperature on the characteristic of the ZnO films. It is concluded that the optimal depositing temperature of the ZnO buffer for the growth of the top ZnO film is 350℃.The correct imaging methods not only help to obtain the real, clear image for the analysis of the samples, but also benefit maintaining the instrument. In this paper, the reasons and solutions have been given for the problems of imaging by the atomic force microscope.Ultra-high density near-field optical storage attracts more and more attention in recent years, which can reduce the recording spot and improve the capacity of optical storage greatly beyond the limitation of diffraction according to the principle of near-field optics. The design of experimental system based on the surface plasmon Poraliton integrated with atomic force microscope for the ultra-high density near-field optical storage has been proposed in this paper. Primary results of simulation about this model and thermal effect experiment of the phase transition film have also been given.