Research Of Anti-Disuturbance Testing System On Smart Cards

This dissertation introduces the domestic and civil integrated cards firstly. Concerning their testing characteristic, developing situation and potential, it discusses the essential of setting up an anti-disturbance testing system on smart cards.According to the analyses of faults that take place to integrated cards, it affirms that we should take the fault-injection method to test integrated card on the basis of card reliability theory. And based on this testing method, it can be divided into two sections to distinguish the contacting anti-disturbance testing system by those so-called contacting and radiant fault injection methods.Introducing the scheme about that contact fault injection in detail, it deeply analyzes the contacting fault-injecting system designed independently at both hardware and software aspect. It shows the communication protocol between injector and testing mainframe, fully accounting for the whole upper layer design and testing process chart meanwhile.Contacting anti-disturbance test comprises signal-breakout test, power supplying stability test and wear-out test. After sorting the results comes from both contacting and radiant fault injection system, the dissertation conclusion basically prove to be advantageous to boost reliability of integrated card, and point out the applicable environment accordingly.It proves out that the testing system can efficiently estimate the capability of side channel cryptanalysis resistance and reliability of anti-disturbance as well, providing designers with feedback information effectively. Advancing the situation of anti-disturbance, it can probably offer a new testing method, which is more convenient, economical and efficacious, and also provide a different feasibility for the automatic research.