Font Size: a A A

Testing Instrument Of PTCR Integrated Characteristic Parameters Based On ATmega16L

Posted on:2009-04-20Degree:MasterType:Thesis
Country:ChinaCandidate:H W MaFull Text:PDF
GTID:2178360278964020Subject:Microelectronics and Solid State Electronics
Abstract/Summary:PDF Full Text Request
Measuration of the properities of PTCR is very important for their theoretical study and application. In this thesis, the design of the hardware and software of the PTCR integrated characteristic parameters testing system based on national standards are introduced. Instrument developments in recent years and the application of MCU techniques in instrument field are discussed at the beginning of this paper. The advantages and disadvantages of the old PTCR parameters testing system are introduced. Combined with the new technologies and methods a new solution is proposed, the PTCR integrated characteristic parameters testing system based on MCU and LCD technique.ATmega16L MCU is chosed as the core of the controlling unit. The core circuit of the controlling unit is base on ATmega16L, working with other departments it can test several parameters. The principles and methods of the circuit are discussed in detail. The interface and controlling method of the LCD unit are introduced in the paper, too.Software is the most important part of the system design. It contains five independent parts, the main program, the operating time testing program, the voltage-withstanding testing system, the current-withstanding testing program, the LCD driving program and the temperature of environment testing program. The design of the software is difficult because of the complexity of the system, so the C language is used to design the programs; as a result the design efficiency is greatly raised. In the software design all the related programs are organized together so as to avoid the conflicting of the hardware resources among the different testing performances and insure the system running orderly and stably. The programs are emulated in the computer by using the AVR STUDIO software.At the end of the paper the debugging of system is introduced. Questions happened in debugging and their solutions are also discussed. Testing results revealed that the system could accomplish the test of PTCR operating time, voltage-withstanding, current-withstanding. It can test the temperature of the inviroment accurately, and reached the intended purpose.
Keywords/Search Tags:MCU, LCD, PTCR, Operating time, Voltage-withstanding, Current-withstanding
PDF Full Text Request
Related items