Research On Base Station Testing Technology Based On MIMO-OFDM

With people proposes the higher request for the transmit speed and system capacity in mobile communication, the new generation communication system need more advanced technology raises transmit speed and character. So 3G-LTE proposes the OFDM as the physic layer modulate technology to raise system the use of spectrum and reduce the jam, at the same time adopt the MIMO antenna to raise the system speed. The use of new technology means the more testing for base station parameter. At the same time, the probability of destructive interference is increasing. So there is huge theories and practical application value in developing the research on Base Station test system based on MIMO-OFDM.The paper researches the base station testing technology and analyses the MIMO-OFDM system theory and LTE base station testing items. It proposes the general design scheme of the base station testing system by LTE-TDD normal. The design scheme includes signal generator and signal receiver. The paper designs the analog circuit and digital logic circuit. The analog circuit includes the DAC,low-pass filter,analog up converter as the signal generator and analog down converter,acquisition circuit as the signal receiver. The system uses DSP,FPGA as the signal Processing and controlling of the digital system to drive the ADC and DAC with the high speed and high Precision by achieving the accurate testing of LTE mobile base station RF parameters.Based on the demand for the base station testing,this paper makes deep and detailed design on each unit circuit of the system, in order to use such a special test circuit to replace a number of traditional test instruments, reduce the cost of the base station testing and provide reference method for the future base station testing on MIMO-OFDM.