The Design Of Optical And Data Gathering System Of Optical-fiber Laser Range Finder System

As the improvement of precision manufacturing,the development of nanotechnology measurement technology, the establishment of nano-measurement test became a very important task of measurement and testing technology. The development of nano technology and micron technology gived a birth to nano-testing technology, whether in fine machining and micro-electromechanical systems, or in the field of physical precision measurement, nano-testing technology had a wide range of applications. Now the methods to measure nano is: ICP capacitance micrometer, x-ray interferometer, heterodyne Laser Interferometer, measurement of SPM. This paper focused on the measurement technology in the field of nanotechnology used in the current dual-frequency laser heterodyne interferometer:(1) All kinds of existing signal process and applying range based on optical heterodyne interferometer were analyzed and researched,then all-optical fiber heterodyne interferometer of two-frequency laser was put forward..(2) Finished the design of optical interferometer structure and overall parameters , include linewidth, laser power, polarization, the reasons of heterodyne interferometer of two-frequency laser were analyzed, then adjusted and measured the optical system.(3) Using PCI-6221 data gathering card and the VC++ to design the interface of data gathering.(4) We conducted a systematic measurement experiment to all the optical parameters, then the first result of the optical path analysis of heterodyne interferometer was put forword (with10kHz frequency shift).Mainly using the all-optical fiber heterodyne interferometer of two-frequency laser, the first stage of dual-frequency laser heterodyne interferometer have been nearly completed and the precision can be reached at nm-level in this paper . These results have reached the domestic advanced level.