Research On The Characteristics And Measurement Of The Shot Noise For Electronic Components

With the constantly in-depth study on shot noise in the mesoscopic physics and nano-electronics, it was found that shot noise can be used to characterize the internal structure information and electronic transmission characteristics for nano-devices. On the one hand, macro-electronic devices contain mesoscopic or nanoscale structures, they can generate shot noise, which may carry on some system internal information. This makes people have a lot of interest in Macro-electronic devices shot noise. On the other hand, with the constant miniaturization of device size, the noise in the electronic devices is also becomes more and more obvious, and have seriously affected the performance of the electronic devices and circuits. In order to suppress them, the mechanism and characteristic of shot noise in macroscopic electronic devices must be researched. Finally, low-noise level devices and circuits will be obtained.For short-channel MOSFET devices, Shot noise includes the channel shot noise caused by the carrier randomly through the barrier near the source of the channel, and gate shot noise caused by the gate tunneling current. Due to the presence of the potential barrier in the diodes, shot noise will emerge inevitably. In the resistors, as long as its resistivity or size to meet certain conditions, shot noise will be found. This paper detailly describes the mechanism and characteristics of shot noise in variety of electronic devices detailedly, and has established corresponding drift-diffusion noise model. In recently years,shot noise is increasingly widely used in non-destructive characterizating of the electronic acting mechanism on electronic and device reliability of non-destructive in electronic devices . This paper points out that shot noise and traps are related, and predicts the applications of shot noise in the device reliability characterization.The main Influencing factors during shot noise testing include: the external electromagnetic interference, the low-frequency 1/f noise, thermal noise and the background noise etc.. To avoid these influencing factors, this paper proposes a low-temperature testing system for shot noise: the specimen is putted into the low temperature device in the shielding room in order to restrain the electromagnetic wave and thermal noise. During testing process, Low-noise preamplifier is adopted to lower the background noise for the testing system. Through extracting high-frequency noise power spectral density, the low frequency 1/f noise can be easily wiped off effectively .We test the shot noise by this testing system for short-channel MOSFETs and the diodes testing, and the results are satisfying.Based on the research on shot noise characteristics and theory, this paper points out that the shot noise and the internal defects in electronic devices are related, and a testing method for shot noise is proposed and to test the shot noise in several electronic devices.