On Test Technology Of Embedded Software And Its Application In Flash File System

With the development of science and technology, the application of embedded system in many fields, such as Internet and aerospace etc, has become more and more popular. As the kernel of the whole system, the quality assurance of the embedded software is very critical. But as a special software product, the quality assurance of embedded software is different from general software. It is difficult to construct a high performance testing system in embedded software developing process.Embedded file system is one of the important parts of Embedded Operating System. As its large capacity and low price, NAND FLASH quickly accepted by the market, so the research on its file system became increasingly popular.Based on the knowledge and theory of software testing, this thesis puts forward a solution for the software product testing after analyzing and investigating the testing configuration, method and strategy of the embedded systems. White box testing strategy and simulation technique is used to test the wear-leveling, drop-resume and dynamic memory distribution of YAFFS file system, which is specially designed for NAND FLASH.This thesis not only gives the testing results, but also investigates the testing scheme and method of embedded software, so it can be used for reference in the testing of other embedded software. An improved scheme is also advanced in the end of the thesis.