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Experiments On The Double-Tip Of Scanning Probe Microscope System

Posted on:2008-07-15Degree:MasterType:Thesis
Country:ChinaCandidate:B WuFull Text:PDF
GTID:2178360215456823Subject:Circuits and Systems
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Nanotechnology is a new subject developed from the end of 20th century. And the Scanning Probe Microscope (SPM) is the most important instrument used in this field. With the development of nanotechnology, SPM, the measuring instrument for this new technology, is expanding and innovating. At the same time, the evolution of SPM also accelerates the research of nanotechnology.In this dissertation, the SPM technology is studied, and the double-tip Scanning Tunneling Microscope (DP-STM) based on SPM technology is investigated in a new way. Furthermore, some achievements have been made. The whole dissertation can be divided into three parts:First, theoretically, the principle and operation method of SPM technology were discussed. And the principle of Scanning Tunneling Microscopy (STM) as well as the Scanning Force Microscopy (SFM), which is based on Atomic Force Microscopy (AFM), was studied. After that, the features and characteristic of some of DP-SPM technology at present were analyzed.Second, the affection of quality of scanning image caused by STM tip was investigated in theoretical, and the affection was explained with a formula. The result that using the I(Z) curve of scanning tunneling spectroscopy could judge the quality of tip was formed. Therefore, the using efficiency of STM tip has been greatly increased. The method was testified in experiment. Finally, the concrete scale of I(Z) curve for judging the quality of tip was achieved. The preparation of tips for the DP-STM also was done.Third, the design for a new DP-STM was put forward and the application value was analyzed. Based on the analyzing of the system configuration of Multimode Scanning Probe Microscope-Solver P47 and the electronic system STM, the resetting of the configuration of the system for DP-STM were realized. And aligning of the double tip was carried out. At last, the I(V) and I(Z) curves of the tunneling junction built up with the two tips were measured. And the result that I(Z) curve was distributed in ladder shape similarly were found.
Keywords/Search Tags:double tip, scanning tunneling microscope, scanning tunneling spectroscopy, scanning probe microscope, nanojunction
PDF Full Text Request
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