The Research And Development Of Full Automatic Semiconductor Arresrer Testing And Sorting System

This thesis describes the development of semiconductor arrester testing and application. On the basis of these, the research and development of full automatic semiconductor arrester testing and sorting system is carried out according to actual demand.First, the thesis analyzes the criterion about semiconductor arrester for the over-voltage protection of telecommunication installations and discusses the characteristic and application of field bus technique. The overall project of the testing and sorting system based on CAN-BUS technique is made by modular design.In hardware, according to the functional require of the testing and sorting system and the composing and operational principle of the mechanism, the central control unit of the system, control main board, is designed and debugged. Besides, the test board which is used for testing the semiconductor arrester's breakover voltage is designed. The thesis goes into particulars the makeup and the design process of the test module for the semiconductor arrester's breakover voltage, which involves the operational amplifier's high voltage enlarge circuit, peak hold circuit and debugging of them.In software, the mainframe test program and the test and control program for each functional module are compiled. The thesis introduced the function and implement method of mainframe program. The rule, which made each module could be debugged by oneself, based on serial communication is established. Each module is a node of CAN-BUS, which could be online debugging by the program loading the microcontroller of them and could correspond with each other by the primary communication protocol.The thesis also summarizes some CAN application layer protocol and refers to the requirement of DeviceNet protocol. The communication that grounded on DeviceNet protocol among intelligent notes of semiconductor arrester testing and sorting system.is realized basically.In the end, a conclusion of this thesis and some new ideas for the testing and sorting system are made.