Structural Analysis And Test Data Optimization Of ATE Systems

With the development of global semiconductor industry, test, which was only asection of IC producing in the past, has being a separate procedure in thesemi-industry chain. More and more testing factories begin to enhance their quality,efficiency and pay attention to the awards and market competition. However, theisolated information point and the contest between different machine suppliers havemade it impossible to realize an uniform testing environment. Then, someimprovement in local, which is the aim of this project, is realizable and significative. According to the low efficiency and cost wasting resulted by different testingstandards, we convert the data format to given method during the course of datacollection. STDF, which is a simple, flexible and undergoing transplanting format, ischoised as the standard because of its catholicity and universality in the area of ATE.Perl language is used as the tool of converting files, which can bring up many merits,such as multi-functional, simple and professional to control text when the aim is notimages and vedio. The log built on Sun flat, will ensure batch controlling andreferring the related information. After introduce the situation and problems in semiconductor industry, the firstchapter affirms the inevitability of format converting and analyses the language tool.The second chapter expatiate the character of binary file then the third and forthchapters analyse and find the organization and unit structure of STDF and dlog file indetails. The fifth chapter converts the dlog file to STDF through Perl according to theorder of modules and produces the log file.