Fiber-Optic Test And Measurement On Planar Lightwave Circuit Chips

Fiber-optic test and measurement on planar lightwave circuit components is the same important procedure as computation and fabrication. The coupling between single mode fiber and PLC chip, the construction ,adjustment, and analysis of test system are two vital issues test technology concerns. Tapered lensed fiber(TLF)can couples optical energy into PLCs integrated with spot size converter high-efficiently. The output mode field diameter(MFD)and divergence angle are predicted by empirical equations, simulated by finite-difference beam propagation method(FD-BPM)numeric tool, and experimentally observed. They are consistent. The coupling between SMF and PLC is investigated and optimum displacement is calculated out. Optical spectrum analyzer(OSA)based on double-pass diffraction grating and photonic all-parameter analyzer based on swept homodyne interferometry(SHI)are illustrated. Uncertainties caused by fiber-component connectivity, power meter, polarization, optical interference, and optical sources are thoroughly demonstrated. Single and arrayed Y-splitters are simulated and deigned. Adiabaticity criteria of branching angle is depicted. Resonant optical filters and Y-splitters are tested in self-constructed measurement system based on the combination of OSA and EELED(Edge Emitting LED). The reasons for measurement differences from computations are given out: the coupling efficiency between TLF and PLC, manufacturing arts, approximation of physical parameters, and simulation on two dimension scale. Finally plan of further research on numeric analysis technique, designing, testing, etc. is put forward.