Simulation Of Er～(3+)-doped Al₂O₃ Optical Wave-guide Amplifier And Measurement Of Er～(3+)-doped Optical Wave-guide Film

With the development of optical communication and integrated optoelectronics, Er3+-doped optical waveguide amplifier (EDWA)has become the hotspot in the field of optical fiber communication and optoelectronics. The main task of this paper is as follows: 1,modelling the characteristics of multi-mode channel Er3+-doped Al2O3 optical waveguide amplifier. 2,measuring the thickness and refractive index of Er3+-doped Al2O3 film.The gain characteristics of EDWA have been investigated by solving numerically propagation equations and rate equations. During the calculation the pump light wavelength is chosen as 980nm and the waveguide cross section is chosen as 1×2μm2. The gain characteristics are functions of waveguide length, erbium concentration and pump light power, so the relations between them are analysed in detail in this paper. The main noise source of EDWA　amplified spontaneous emission (ASE) is also discussed here. In the brief summary, the method is extended to solving different size of EDWA, which has some reference value for the following study and the design of waveguide amplifier.At present, many studies are to making Er3+-doped film and perfect its characteristics. Hereby the main characteristics of Er3+-doped film 棗thickness and refractive index are measured here according to the present condition.