| Due to the fact that the properties of infrared detector array can't be satisfied to produce a image with high resolution because of the level of manufacture, the phenomenon of subsampling and serious aliasing emerges. In order to reduce these phenomenon and improve the image resolution the technique of microscanning is introduced.In this paper the theory of microscanning is described and the process of imaging of microscanning is simulated theoretically, meantime, the possibility of improving the quality of image using microscanning is deduced from the sampling theorem. The concept of pixel transfer function is introduced and the pixel transfer function and its curves with different filling factor of detector array are presented. The difference between the image obtained through method of microscanning and the single sampling image is simulated by computer based on the theory of microscanning. The sampled image and the images constructed with microscanning are presented as well.From the result of simulation through computer the technique of microscanning can effectively reduce the aliasing effect and improve the final resolution of the image. Due to the fact technique of microscanning makes use of the compensative information between each single image with different order, the information of the original image can be recovered very well. |
