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Residual stresses in cubic boron nitride thin films deposited by ion-assisted laser ablation

Posted on:1996-09-23Degree:Ph.DType:Dissertation
University:University of California, DavisCandidate:Cardinale, Gregory FrankFull Text:PDF
GTID:1461390014988230Subject:Engineering
Abstract/Summary:
Residual stresses of cubic boron nitride (cBN) thin films deposited using ion-assisted pulsed laser ablation were investigated. The residual stresses were determined by measuring the deflection of cantilever beams micromachined from (100)-oriented silicon, and the hardness and elastic modulus of sp...
Keywords/Search Tags:Stresses
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