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Fabrication and Characterization of Amorphous/Nanocrystalline Thin Film Composite

Posted on:2015-04-11Degree:Ph.DType:Dissertation
University:University of ArkansasCandidate:Newton, Benjamin SFull Text:PDF
GTID:1458390005481431Subject:Engineering
Abstract/Summary:
Combining the absorption abilities of amorphous silicon and the electron transport capabilities of crystalline silicon would be a great advantage to not only solar cells but other semiconductor devices. In this work composite films were created using molecular beam epitaxy and electron beam deposition interchangeably as a method to create metallic precursors. Aluminum induced crystallization techniques were used to convert an amorphous silicon film with a capping layer of aluminum nanodots into a film composed of a mixture of amorphous silicon and nanocrystalline silicon. This layer was grown into the amorphous layer by cannibalizing a portion of the amorphous silicon material during the aluminum induced crystallization. Characterization was performed on films and metallic precursors utilizing SEM, TEM, ellipsometry and spectrophotometer.
Keywords/Search Tags:Amorphous, Film
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