Spectropolarimetric characterization of light scattering materials

UV-VIS-NIR Mueller matrix polarimeters are virtually non-existent due to the scarce availability of optical components performing optimally in such a broad waveband. A spectropolarimeter that measures the complete Mueller matrix of samples in transmission and reflection (ellipsometric) modes from 300 nm to 1100 nm at a high spectral resolution has been successfully designed, developed, calibrated and tested as part of this dissertation. The complete polarimetric characterization of light scattering materials is thus made possible.;Differentiating polarization properties of light scattered from various atmospheric particulate matter species, including pollen, dust, soot and B. subtilis, have been identified. This demonstrates the feasibility of this technique for the discrimination of bio-aerosol from ambient clutter.;Spectral Mueller matrix measurements of Gallium nanoparticles deposited on Sapphire substrates are presented which enables the developed system to locate the associated Localized Surface Plasmon Resonances (LSPRs). Additionally, the depolarization produced by such a nanoparticle system, not quantified previously, is measured by the developed system and duly presented.