| We have developed a synchrotron x-ray diffraction microscope at beamline 1-ID of the Advanced Photon Source capable of resolving Bragg reflections from the bulk in single crystals and coarse-grained polycrystalline materials. This three-dimensional x-ray diffraction microscope (3DXDM) can simultaneously map the spatial location, crystal orientation, and strain of ∼1000 grains in a polycrystal. Spatial accuracy is currently 30mum, with potential to reach a few mum. We can map the microstructure of 1 mm3 of material in 20 hours, or track the growth and change in orientation of a single grain in situ during annealing with a time resolution of 10 s. The measurements are non-destructive. This instrument has great potential to aid in investigations of basic problems of grain growth and deformation in materials.; In this dissertation, we develop the mathematical and computational framework underlying the acquisition and analysis of 3DXDM data, and illustrate the power of the instrument by analysis of four types of data sets. Measurements of single crystal Si and Al serve to calibrate the instrument and demonstrate its resolving power. Measurements of a drawn-wire Au sample are used to develop the capability of resolving intragranular strain. An industrial purity Al sample is mapped ex-situ during a series of anneals. Finally, a single grain in an Al polycrystal is tracked in situ during annealing. A complete description of the instrument and data collection techniques is provided. |
