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Research On Measurement And Positioning Method In Large Complex Field

Posted on:2015-12-31Degree:DoctorType:Dissertation
Country:ChinaCandidate:Z X LiuFull Text:PDF
GTID:1228330452970618Subject:Instrument Science and Technology
Abstract/Summary:PDF Full Text Request
Large complex field is one of the basic features of large-scale equipmentmanufacturing industry. It has some characteristics such as large spatial dimension,complex and diverse measuring objects, numerous disturbing factors, harshenvironmental conditions, which make the conflict between high efficiency, highaccuracy measurement and complex field condition prominent. With the rapiddevelopment of advanced manufacturing technology, solving various measurementproblems in large complex field through flexible, accurate and efficient large-scalemeasurement methods has been imperative in modern large-scale equipmentmanufacturing industry. Comparing with existing large-scale metrology techniques, anovel network measurement system based on optoelectronic scanning shows itsdevelopment potential and application prospect in the measurement of large complexfield with some powerful features, especially precise and dependable performance,flexible and efficient application characteristics and the potential ability to provideversatility.Considering the measurement problem and engineering requirement in largecomplex field, this thesis presents the research idea based on the optoelectronicscanning network measurement system. It focuses on the research of wMPS(workspace Measuring and Positioning System), studies the principle ofoptoelectronic scanning angle measurement and the compensation of disturbing errorsin depth, and proposes novel positioning methods under the condition of locationlimitation and occlusion. The main research work of this thesis is as follow:1、The urgent requirement of advanced large-scale metrology technique in largecomplex field is summarized. Considering the feasibility and application limitationsof multiple measurement methods, the outstanding advantages and potential ability tobe applied in large complex field of the optoelectronic scanning network measurementsystem are expounded. The critical issues of its application in large complex field arealso indicated, and following research has been carried out.2、Based on the research of the principle of optoelectronic scanning anglemeasurement, the influence of angle measurement caused by the shafting structure of wMPS transmitter is studied. Then the dynamic performance of it is analyzed usingfinite element method. The theory is provided for the design and optimization of theshafting structure, and the overall measurement performance of the wMPS ispromoted at the source.3、 In order to eliminate the influence of optoelectronic scanning anglemeasurement caused by the disturbances, differential compensation method usingsingle reference point and network differential compensation method based on virtualreference point are presented. The adaptability of the wMPS in harsh environment isimproved, and the basic guarantee for its precision measurement ability in largecomplex field is also provided.4、Considering the location limitation of the transmitters in complex field, themulti-angle resection positioning method based on single transmitter is presented. Themathematical model is constructed. The coordinate calculation algorithm and theimpact factors of positioning error are studied. The structure parameters andcalibration of measuring target are also discussed, and the feasibility andmeasurement accuracy of the proposed method is verified through the experiment.5、Considering the occlusion problem in complex field, the positioning methodwithout intersection is presented, which is based on multi-angle circumferenceconstraint. The impact factors of measurement accuracy are studied. Thecircumference receiver is designed and the calibration method is presented.Experimental platform is constructed to verify the feasibility and accuracy of theproposed method.
Keywords/Search Tags:Large complex field, Large-scale metrology, Optoelectronicscanning, Reference point network, Multi-angle resection, Multi-angle circumferenceconstraint
PDF Full Text Request
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