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Keyword [BIST]
Result: 141 - 154 | Page: 8 of 8
141.
Design and test of high-performance analog-to-digital converter based on subranging architecture
142.
Built-in self-test for interconnect faults via boundary scan
143.
A method of constructive test point insertion for scan-based built-in self-test
144.
Methodologies for built-in self-test insertion in VLSI circuits across the design hierarchy
145.
MADBIST: A scheme for built-in self-test of mixed analog-digital integrated circuits
146.
Test generation and embedding for built-in self-test
147.
Low-Overhead Built-In Self-Test for Advanced RF Transceiver Architectures
148.
Calibration of MEMS capacitive accelerometers using Electrical Stimulus BIST
149.
Generation of compact test sets and a design for the generation of tests with low switching activity
150.
Monitoring And Prediction Technology Of Stress Damage In Complex Digital Circuit
151.
Program Design Of TCAM Memory Bist
152.
Design And Implementation Of A General Built-in Self-test Circuit For DDR SDRAM
153.
FPGA Solder Joint Based On Improved LS-SVM Esearch On Failure Assessment Method
154.
Research And Implementation Of Key Techniques For High Coverage And Low Voltage SRAM Testing
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