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Keyword [TDDB]
Result: 21 - 28 | Page: 2 of 2
21.
Simulation And Testing-analysing Of TDDB Of 65nm Metal Oxide Semiconductor
22.
Study Of Time-Dependent Dielectric Breakdown Based On 65nm Commercial CMOS Process
23.
Research On Reliability Evaluation And Design Technology Of Deep Submicron CMOS VLSI
24.
A Study On The Tddb Characteristics Of Gate Oxide Layer In 4H-SiC MOS Devices
25.
Base On Deep Submicron Integrated Circuit,Study On The Structure And Performance Improvement Of MIM Capacitor
26.
Scalable Methods for Reliability Analysis in Digital Circuits using Physics-Based Device-Level Models
27.
Copper interconnect reliability on integrated circuits
28.
Study On The Gate-oxide Interface Characteristics Of 4H-SiC MOS Devices
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