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Keyword [TDDB]
Result: 1 - 20 | Page: 1 of 2
1.
Study On SOI RESURF Principle And Fabrication Of SOI LDMOS
2.
Percolation Methodology For The Modeling And Simulation Of The Reliability Issues Of Microelectronics Devices
3.
The Study On The Reliability And Failure Mechanism Of Copper Interconnection In VDSM
4.
Study On The (Ba
0.65
Sr
0.35
)TiO
3
Pyroelectric Thin Films Materials And Infrared Detectors
5.
Lifetime Modeling And Characteristics Of TDDB In VLSI Copper Interconnection
6.
A Process Recipe Improvement For Gate Oxide Of High-voltage MOS Devices
7.
Research Of OTP Memory Design
8.
Studies On Preparation And Breakdown Characteristics Of Gd
2
O
3
Doped HfO
2
High-k Gate Dielectrics
9.
The Reliability Study For Oxide Integrity
10.
Deep Submicron Cmos Device Gate Oxide Tddb Behavior (tddb) And Its Mechanism
11.
.65 Nm, Metal Trench Etch Process Development
12.
Application And Improvement Of Silicon Nitride In Copper Interconnection Of Integrated Circuits
13.
The Reliability Of The Nitrogen Ion Implantation On Gate Oxide Tddb Effect
14.
Research On The Reliability Of High-k/Metal Gate
15.
A Board-Level Prognostic Monitor Circuit Design For Gate Dielectric TDDB
16.
Study And Analyze For Interface State Property And Reliability Of The MOS Devices
17.
Effects Of Nitrogen Plasma POA On TDDB Characteristics Of SiC MOS Dielectric Layer
18.
A Study On The Mechanism Of The SiC/SiO
2
Interface Of SiC MOS Devices
19.
Research On PUF Based On TDDB Effect
20.
Research On Age Sensor Technology Based On TDDB Effect
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