| Consumers are demanding more and more value for each dollar spent on new electronic equipment. Built-In Self-Test (BIST) of electronic circuits and equipment will help to satiate the demand for self test, self diagnostics, and self repair. This dissertation explores a technique for a Mixed Analog Digital BIST (MADBIST) on a mixed-signal Integrated Circuit (IC). Specifically, on-chip tests for the Analog-to-Digital Converter and Digital-to-Analog Converter on the mixed-signal IC are developed. (The digital portion of the IC can be tested using digital BIST techniques). The tests implemented include Frequency Response, Signal-to-Noise Ratio, Gain Tracking, Inter-Modulation Distortion, and Harmonic Distortion. A precision analog test stimulus is efficiently generated on-chip using digital circuitry. The test stimulus itself is encoded within a Pulse-Density-Modulated bit stream. A narrow-band digital filter is employed to extract the measurement results. Experimental results from a test chip and a prototype circuit board are provided. Some of the engineering and economical trade-offs associated with the design of the tests are considered. The overhead required to implement several types of tests is dealt with. We also explore the relationship between the accuracy achieved by the test and the amount of resources required to implement it. |
