Methods Research And System Construction Of Nano Film Materials Magnetic Permeability Measurement

In recent years,with the rapid development of electronic information technology and adaptive camouflage and stealth technology,nano thin film materials have become increasingly widely used in various fields.In order to meet the military requirements of camouflage stealth compatible electromagnetic shielding,multifunctional electromagnetic shielding films are often prepared using nanoscale materials.However,there are still significant shortcomings in the measurement of electromagnetic parameters for such nanoscale materials,and there is a lack of targeted methods and necessary high-precision measurement methods.Therefore,the measurement of electromagnetic parameters of nanoscale thin film materials has become a research hotspot in the field of camouflage and stealth.Due to the thickness of the thin film reaching the nanoscale,it will have a significant impact on sensitivity and testing accuracy.Therefore,it is necessary to accurately measure the complex magnetic permeability of nano thin films and improve their testing accuracy.In the development and production process of nano thin film materials,accurate measurement of electromagnetic parameters of thin film materials enables simulation calculations,optimized design,and performance evaluation of thin film materials,thereby making the produced nano thin film materials more suitable for engineering applications and of great significance for improving future testing capabilities.Therefore,this article focuses on the measurement method and system construction of complex magnetic permeability of nano film materials.Firstly,a method measuring and calculating electromagnetic parameters of nano thin film materials was proposed.On the basis of comparing the advantages and disadvantages of different methods for measuring electromagnetic parameters of materials,the transmission reflection method of short-circuit microstrip lines is selected.The magnetic permeability of the nano thin film material is obtained by measuring three curves: no-load,only millimeter level dielectric substrate,and nano thickness magnetic thin film coated on the medium.Secondly,a complex permeability measurement system for nano film materials was constructed.In terms of hardware simulation,a fixture model for measuring complex magnetic permeability was established.Based on the transmission mechanism and formula derivation of electromagnetic field theory,the fixture was modeled and optimized using electromagnetic simulation software HFSS to determine the optimal size.The three S-parameter curves in the simulation results were imported into Matlab,and the complex magnetic permeability of the nano magnetic thin film was calculated using algorithms.In the software part,Labview software is mainly used to realize the test function,and the main measurement processes such as initialization,frequency control,measurement and extraction of S parameters of vector network analyzer,calculation of electromagnetic parameters and display of its measurement curve data storage on the front panel are determined accordingly.Then use coaxial cable to connect vector network analyzer and hardware fixture,and use network cable to connect vector network analyzer and test software to achieve optimal configuration of test environment.Finally,the experimental scheme for the complex permeability measurement of nano film materials and the Functional verification of the system are designed,and the verification and result analysis are carried out.The main step of verification is to place the film to be tested into a measuring fixture,analyze the measurement results,and then compare the results with known theoretical values of magnetic permeability.Analyze the source of error in the measurement results,use transmission line theory and formula derivation,analyze the impact of errors generated during mold processing on the measurement results,and propose methods for improving and reducing errors in the entire testing system based on the above analysis.The experimental results show that the fixture designed in this article has good stability and high measurement accuracy in the frequency domain range of 0.1 to 6.5GHz for measuring nanoscale thin films,meeting the testing requirements for the complex magnetic permeability of magnetic thin films.It provides a method and means for measuring the electromagnetic parameters of nanoscale thin film materials.