Investigation Of Noval Synchrotron-based Structural Characterization Techniques

Structural characterization is very important for material research.X-ray diffraction(XRD)is a particularly important and widely used technique for material structure characterization.Compared with the conventional X-ray source,the synchrotron radiation source has a series of advantages.Recently,the performance of the synchrotron radiation source has also been greatly improved with the development and continuous upgrading of synchrotron radiation facilities.At the same time,the synchrotron-based structure characterization technique is also constantly developing.For example,the acquisition of X-ray diffraction signals has expanded from the conventional one-or two-dimensional to three-dimensional in the diffractive reciprocal space.This thesis mainly focuses on the synchrotron radiation diffraction technique.Aiming at the deficiencies in synchrotron radiation thin film diffraction technology and in-situ real-time structure characterization technology,two studies on synchrotron radiation methodology are carried out.In addition,using synchrotron surface diffraction,structural characterization of several thin films has been performed.The content of this thesis is as follows:Chapter 1:Introduction,briefly introduces the history of synchrotron radiation development,the unique merits of the synchrotron radiation source,and its application in materials research.In the end,introduces the main content of this thesis.Chapter 2:synchrotron radiation X-ray three-dimensional diffraction technique.Introduces the basic principles of X-ray diffraction,the history of three-dimensional diffraction technique development.Elaborate the extensive three-dimensional diffraction technique,including the data acquisition method,data processing process,and data correction method.Furthermore,exhibits the software coded in Python that can process x-ray data fast and efficiently.Chapter 3:This chapter proposes an in-situ real-time structural characterization scheme.The scheme combines energy-dispersive XRD and XAFS techniques to obtain short-range and long-range ordered structure information of materials,with a potential temporal resolution of micron second.Chapter 4:This chapter uses X-ray diffraction technique to study the structure of several thin films,i.e.,the structure of BaTiO3/Fe film heterojunction was researched in the substrate transfer process;the structure of Yttria-Stabilized Zirconia(YSZ)film was characterized,and the mechanism of YSZ’ high fracture toughness.Chapter 5:The main content of this thesis is briefly summarized and prospected.