Research On Calibration Technology In Device Measurement And Circuit Design

Calibration technology has always played an important role in the field of integrated circuit design.There must be no mistakes in the traditional general chip design process,because of its high investment cost and long design cycle.For some high-demanding chips,perfect performance must be guaranteed.However,the entire process of chip manufacturing contains many uncontrollable factors.Therefore,it is necessary to analyze the influencing factors and perform corresponding calibrations at different stages to reduce process errors.Devices are the basic elements that make up the circuit,the function simulation of the circuit is the foundation of chip manufacturing.Therefore,this paper studies the importance of calibration technology to improve the efficiency of integrated circuit design and realize the expected functions through spin-torque magnetic tunnel junction(STT-MTJ)devices and temperature sensor circuits:1.Aiming at the inaccurate measurement results caused by external factors such as measurement equipment during the device measurement process.A de-embedding method based on TRL(Thru-Reflect-Line)calibration is proposed.Different types of PCB boards are designed and manufactured through power integrity simulation.Then the STT-MTJ device is measured and calibrated at high frequency.Through the comparison of experimental data,it is found that this method effectively eliminates the influence of signal transmission loss caused by measuring instruments,connecting wires,fixtures,and measuring substrates.Obtained more accurate electrical characteristics of the device.2.Aiming at problems such as the lack of device parameters that need to be used in the circuit simulation process.Perform high-frequency equivalent circuit modeling on the calibrated STT-MTJ device.The parameters of the equivalent circuit model are extracted through radio frequency simulation and parameter conversion.Then the simulation verifies the accuracy of the model for predicting the static and dynamic characteristics of the device.The established equivalent circuit model can be used by researchers for embedded circuit simulation,which can effectively improve the simulation efficiency.Similar research methods can design the process model of the device so that the EDA software can call the simulation.These are inseparable from accurate measurement and calibration of the device.3.In view of the error between the simulation results of the temperature sensor circuit with high linearity requirements and the actual manufactured product.The CMOS temperature sensor circuit is selected,and the module design and basic circuit simulation are carried out.The simulation results showed that the temperature output curve will have serious non-linear phenomena due to the parameter changes of some devices caused by the technological process.4.Aiming at the non-linear phenomenon of the output voltage in the simulation of the temperature sensor circuit.The possible causes of this phenomenon were analyzed,and it was determined that the deviation of the resistance during the process would cause the curvature problem.Then the corresponding calibration was designed for different calibration requirements.After calibrated circuit simulation and data analysis,the overall performance of the designed CMOS temperature sensor with calibration function can be obtained.The temperature measurement range is-40 ??125 ?,the working voltage is 2.8 V?6 V,and the slope of the temperature output curve is about 8.65 m V/?,and the temperature measurement error is less than ±0.5?.The correlation coefficient of the linear fitting is 0.99996.This shows that the designed temperature sensor can meet the design requirements of linearized output when the calibration circuit is used.