Modification And Optimization Of The Device For Electrical Property Measurement Of Semiconductor Materials

The emergence of semiconductor materials has promoted the development of science and technology and brought our society into a modern lifestyle.At present,semiconductor materials play an extremely important role in various fields such as industry,agriculture,commerce,science and technology,education,health,bioengineering,and aerospace.The electrical properties such as resistivity,Hall coefficient,Seebeck coefficient,carrier concentration and Hall mobility are very important performance parameters in the study of semiconductor materials.Among the existing commercial instruments,some instruments can simultaneously measure resistivity and Seebeck coefficient,while as some instruments can measure resistivity and Hall coefficient.However,there is less commercial equipment can measure all these paramenters together besides the PPMS(Quantum Design).Unfortunately,the PPMS equipment is very expensive and the requirement for sample size and shape is also quite specific.Therefore,it is of great significance to develop a new device that can fullfil all the electrical parameter measurement of semiconductive materials.This thesis describes the measurement principles and methods of the device for semiconductor material electrical performance measurement developed by our lab.The advantages and disadvantages of the device have been compared with some similar instruments,and the main problems were then pointed out.Consequently,the large sample stage has been comprehensively improved and a series of problems,such as high temperature of the sample stage,hidden danger of electric shock,probe elasticity and Seebeck measurement method,have been solved successfully.According to the newly designed sample stage,the complex circuit system of the semiconductor material electrical performance measurement device has also been readjusted and sorted out.The integrated chip with the control circuit installed on the new circuit board replaces the original two modules t M-C8 and I-7061 D,and also combines the control circuit of the motor,making the entire circuit system simple and clear;The use of signal relays replaces the previous ordinary relays,making the circuit board’s ability to resist electromagnetic interference enhanced and the electrical signal conduction more stable.Combined with the improvement of the measuring device hardware,the C #programming language was used to re-develop a measuring device software system with a simple and clear interface,simple and convenient operation,and a complete test function.It focuses on the implementation method of the main functional modules of the measurement software,and introduces the flow and method of using the measurement software.At the end of this paper,a verification test is carried out on the electrical performance measurement device of semiconductor materials.The P-type Mn Te samples were tested on this measuring device and commercial measuring instruments and compared with each other.The test results were found to be basically the same,which verified that the measuring device was reliable and accurate.In addition,the uncertainty of the measurement device was calculated and found to have a tendency to increase with temperature,but the temperature range from room temperature to 573 K was within the allowable test error range.Therefore,the test quality of this measurement device was further verified Reliability.