Research On Wavelength Accuracy Calibration Of Monochromator Based On Continuous Light Source And Fourier Transform Spectrometer

With the increasingly prominent energy issues,solar energy has attracted worldwide attention as a clean renewable energy source.The rapid development of China’s photovoltaic industry has become an urgent requirement for the accurate measurement of photovoltaic performance parameters of standard solar cells.Standard solar cells play the role of “numerical carriers” in photovoltaic metrology.This project is intended to address the need for the accuracy assessment of the wavelength of the emitted light from the monochromator by a standard high-precision measurement system based on a tunable laser source.When a standard solar cell is measured by a measurement system based on a laser source and a monochromator,the center wavelength of the monochromatic light incident on the surface of the solar cell will be determined by the center wavelength of the emitted light of the monochromator,and therefore its wavelength accuracy is required.Perform calibration and analysis.The calibration results can be used to analyze the effect of the measurement introduced by the central wavelength and bandwidth of monochromatic light.This article will study from the following aspects:1.The theoretical research on the calibration method of the wavelength accuracy of the monochromator based on the continuous spectrum light source and the Fourier transform spectrometer is proposed,and the experimental system platform is set up.The wavelength calibration of the Fourier transform spectrometer was first performed using a low pressure mercury lamp to obtain the wavelength deviation.Through experiments,data in the target wavelength range of 400 nm to 2000 nm was obtained at intervals of 5 nm.The source of the uncertainty component that affects the system measurement is analyzed,and the method uncertainty evaluation is performed to obtain the combined uncertainty of the method.2.Carry out the calibration method based on atomic emission line lamp,set up experimental system platform,obtain the experimental data of the characteristic wavelength point of the atomic emission line lamp,and fit the data to the optimal curve.The source of the uncertainty component that affects the system measurement is analyzed,and the method uncertainty evaluation is performed to obtain the combined uncertainty of the method.3.The comparison results of the uncertainty of the wavelength accuracy of the monochromator calibrated by the two methods are given.The analysis is based on the characteristics and advantages of the Fourier transform spectrometer method.The goal is to achieve the traceability of wavelength accuracy measurements of international SI units,and the characteristics and advantages of the experimental schemes used in the analysis.The obtained measurement results can provide data support for the comprehensive evaluation of the measurement accuracy of the high-precision measurement device based on the laser source standard system.