| Two-dimensional transition metal dichalcogenides(TMDCs;e.g.,MoS2,WS2,WSe2,WSe2)have exhibited many novel physical and chemical properties due to their tunable semiconductor electronic structures.Many empirical findings have indicated that TMDCs have a wide range of applications,such as transistors,photodetectors and photovoltaic cells.Among TMDCs,MoS2has been getting the most extensive attention.As the monolayer MoS2and other TMDCs were successfully grown on substrates and widely used in thin-film microelectrode devices,heterostructure of TMDCs have been found to have more excellent optoelectronic properties comparing with the single TMDCs,and are also expected to fulfill the continuously increasing demands for the integration and functionality of elect ronic and optoelectronic devices.Realizing the controllable preparation of Mo S 2 and its heterojunctions is a crucial prerequisite for manufacturing high-performance integrated devices.In recent years,chemical vapor deposition(CVD)has been manifested to be a triumphant approach to prepare various 2D layered materials.However,the study of the growth mechanism of MoS2 film by CVD is still in its preliminary stage,and the TMDCs based heterojunctions are rarely reported.Therefore,more effects are needed in this regard.In this paper,the controllable preparation of MoS2 film and its heterojunctions was successfully achieved by the CVD method,and the effects of various growth conditions,the growth process,and the deposition mechanism of them were studied in detail.Besides,the monolayer MoS2and the heterojunction devices were fabricated and tested,providing a certain theoretical basis and data support for its applications.The details are as follows:1.A high quality,large-area,uniform continuous monolayer MoS2 film was successfully grown on the SiO2/Si substrate by the CVD method.In order to improve the repeatability of the experiment,the influences of growth temperature,reaction time,carrier gas flux and other factors on the growth of the monolayer MoS2 film were investigated.Based on a series of characterization analyses,we presented a possible deposition mechanism of the MoS2 film by describing its growth process.It has been experimentally proved that the proposed deposition mechanism has a certain guidance significance for realizing the controllable preparation of the continuous monolayer MoS2 film.2.A monolayer MoS2 back-gated field effect transistor(1LMoS2-FET)was constructed based on the conducting channel of the as-grown continuous monolayer MoS2 film,and an average carrier mobility of~9.8 cm2 V-1s-1 and a mean ratio of Ion/Ioff of~3.1×106 were achieved with an array of 20 1LMoS2-FETs.The metal-semiconductor contact characteristics between MoS2 and Ti were analyzed and thoroughly discussed by drawing the contact energy-band diagrams of them under different bias voltages.3.A seamless lateral heterojunction of MoSe2/MoS2 was successfully grown on the substrate by using a two-step CVD method.A characterization analysis revealed that the MoSe2 was laterally and epitaxially grown along the triangle edges of the monolayer MoS2,eventually leading to the formation of a heterojunction.Our result would benefit the study of the growth mechanism of the lateral heterojunction of MoSe2/MoS2 and shed some light on the preparation of other novel heterojunctions and superstructures of TMDCs.4.The energy-band diagrams of the lateral heterojunction of MoSe2/MoS2 under the light and the dark state were plotted and analyzed,and the measured volt-ampere characteristics curve of the heterojunctions were analyzed in detail.The band alignment in the MoS2/MoSe2 heterojunction was a typical type-Ⅱstaggered gap,which can urge the effective separation of photoinduced electron-hole pairs,leading to a prolonged longevity of the photoexcited charge carrier,and a suppression of the interfacial electron-hole recombination.Efficient p-doping in MoSe2 and n-doping in MoS2 nanolayers will be produced handily by light irradiation. |