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Single Ionization Of Neon Atoms Induced By XUV Pulses

Posted on:2021-12-25Degree:MasterType:Thesis
Country:ChinaCandidate:J T LeiFull Text:PDF
GTID:2480306092470554Subject:Nuclear Science and Technology
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Few-body problem concerns the heart of quantum theory and is one of the fundamental questions that need to be addressed.From the last three decades,as the laser pulse becomes shorter and shorter,it has provided us unique opportunities to study dynamics of the few-body system with unprecedented precision.On one hand,in order to explore the electronic information of the inner shell of atom and molecule,higher energy photon is required.High-order Harmonic Generation(HHG)is one of the robust methods which can produce extreme ultra-violet laser(XUV).On the other hand,higher photon energies enable us to separate clearly from the non-linear processes raised in strong field and single-photon inner shell ionization provides unique perspective to electron correlations.Nowadays,as the table-top XUV sources are commercially available,atomic processes induced by XUV photons are vastly studied.In this thesis,single ionization of Ne atom induced by a linearly polarized XUV photon with an energy of 36.1 eV is studied.The present work finishes the construction of the platform dedicated to ultrafast quantum few-body dynamics.Such a platform consists of a monochromatic XUV laser beam line and a reaction microscope.A series of calibrations on the reaction microscope has been achieved,including: the delay line hex anode detector,the time-of-flight spectrometers for both electrons and recoil ions,the supersonic gas jet system with multi-differential pumping stages and so on.The experiment on single ionization of Ne by linearly polarized XUV photon is performed,including: data processing,decoding,electron/recoil ion momentum reconstruction,calibration of the XUV single-photon energy and so on.The asymmetry parameter of the electron angular distributions obtained by 36.1-eV XUV photon is found to be ?=0.665±0.011 which agrees well with predictions based on Hartree-Fock calculations.Reaction Microscope enables simultaneous measurement of electrons emitted from the entire space.Compared with the traditional electron spectrometers that can only measure electrons with a specific exit angle,Reaction Microscope with the full-space measurement capability can avoid the uncertainty caused by the data normalization of traditional experimental methods,so the data obtained is more accurate.The experimental platform lays a solid foundation for the high-precision measurement of experiments about molecular ionization and dissociation induced by XUV pulses.
Keywords/Search Tags:XUV pulse, Reaction Microscope, Photoelectron angular distribution, ?-asymmetry parameter
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