Polarimetric scattering behavior of rough dielectric materials at terahertz frequencies

Technologies in the terahertz region of the spectrum are finding increased usage in areas such as communications, remote sensing, and imaging, For example, driven by the promise of greater data transfer rates, free-space communication that traditionally operate in the radio and microwave bands are being developed at terahertz frequencies. Successful transition of communication systems to higher frequencies, particularly for systems located in indoor or urban environments, will require a thorough understanding of the reflection, transmission, absorption, and scattering behavior of a wide variety of materials and surface types. Scattering properties of rough surfaces have been studied extensively at radio and microwave frequencies, however, such properties have only recently become of interest at higher frequencies. The goal of this thesis was to develop a better understanding of electromagnetic scattering from dielectric rough surfaces at millimeter wavelengths and terahertz frequencies. This goal was achieved by measuring the polarimetric scattering behavior of dielectric materials and comparing the measured data to predictions made by rough surface scattering theory. The dielectric properties and the roughness of the samples were tailored in order to provide a controlled parameter space to investigate. Fully polarimetric radar imagery of the rough surfaces were acquired at 160 GHz, 240 GHz, and 1.55 THz. The backscattering measurements were collected as a function of polarization, incident angle, and frequency. The applicability of various rough surface scattering theories was determined for the different roughness regimes studied.