| In this thesis, the current need for a non-destructive microstructure characterization tool, named grazing incidence small angle x-ray scattering (GISAXS), for the study of the microstructure in thin polymer films is addressed. This experimental tool, unlike the conventional small angle x-ray scattering (SAXS) technique which is performed in a transmission mode, allows a considerable increase of the x-ray path inside the thin layer to be analyzed, and provides valuable information that is complementary to that available from more familiar surface-sensitive techniques including x-ray reflectometry, grazing-incidence diffraction, atomic force microscopy, and transmission electron microscopy. The extensive modifications of the existing in-house SAXS facility to enable the performance of in-house GISAXS measurements are described. Labview programs have been developed to provide a user-friendly interface to perform GISAXS alignment with position sensitive detection. A detailed GISAXS alignment protocol has been developed and is described. Experimental results on test samples are presented to demonstrate the capability of performing GISAXS measurements in this lab. This work allows preliminary studies in thin films and surfaces in preparation for performing high resolution work at off-site synchrotron sources. |
