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Towards Automated Nanomanipulation under Scanning Electron Microscopy

Posted on:2013-08-07Degree:M.A.ScType:Thesis
University:University of Toronto (Canada)Candidate:Ye, XutaoFull Text:PDF
GTID:2458390008479040Subject:Robotics
Abstract/Summary:
Robotic Nanomaterial Manipulation inside scanning electron microscopes (SEM) is useful for prototyping functional devices and characterizing one-dimensional nanomaterial's properties. Conventionally, manipulation of nanowires has been performed via teleoperation, which is time-consuming and highly skill-dependent. Manual manipulation also has the limitation of low success rates and poor reproducibility. This research focuses on a robotic system capable of automated pick-place of single nanowires. Through SEM visual detection and vision-based motion control, the system transferred individual silicon nanowires from their growth substrate to a microelectromechanical systems (MEMS) device that characterized the nanowires' electromechanical properties. The performances of the nanorobotic pick-up and placement procedures were quantified by experiments. The system demonstrated automated nanowire pick-up and placement with high reliability. A software system for a load-lock-compatible nanomanipulation system is also designed and developed in this research.
Keywords/Search Tags:Manipulation, System, Automated
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