| Triticum aestivum, common wheat, is a widely grown crop that is responsible for a large portion of worldwide consumed calories. Bread wheat is an allohexaploid derived from a series of hybridization and polyploidization events between three diploid progenitor species. Due to its origin, genetic diversity across the hexaploid wheat genome is lacking, especially in the D genome. Ae. tauschii, the D genome diploid progenitor, is an important source of D genome variation and has been used to identify novel genes for multiple traits including disease resistance. The evolution and spread of new pathogenic Puccinia races highlight the need to identify and utilize novel sources of disease resistance. A recombinant inbred line population was derived from a cross between the synthetic 9.131.15(tetraPrelude/TA2474) and KS05HW14, a hard white winter wheat. This population was phenotyped for resistance to stem, stripe and leaf rust. All-stage resistance to stem and stripe rust was mapped on 5BL and 4DS originating from 9.131.15 and TA2474, respectively. Leaf rust resistance was mapped to 3BL and adult plant resistance QTLs were mapped to the 6D and 7D chromosomes for leaf and stem rust resistance in Mason, MI in 2017. This study identifies resistance to all three Puccinia rust species in this RIL population. However, further work is needed to determine if the 4DS and 5BL loci are novel and the identified adult plant resistance QTLs can be repeatedly observed. A single RIL was phenotyped as resistant to all three Puccinia fungal pathogens in all tested environments. This line can be used as a useful source of disease resistance to these fungal pathogens. |
