Research On Frequent Itemsets Mining Algorithm Of Soybean Promoter Based On Bit Combination

With the development of genetic engineering,the construction of high-level heterologous protein expression vectors is increasing.The level of exogenous gene expression,the starting time and degree of gene expression,gene activity and so on are all affected by promoters.This paper is based on the promoter data of soybean gene,through the application and improvement of frequent itemset mining in data mining,to provide new ideas for improving the efficiency of gene promoter data mining.Firstly,this paper introduces the purpose and significance of this study,and clarifies the research value of this paper.Then,a serial design idea of frequent itemsets mining algorithm for soybean promoter based on bit combination is proposed.It is an algorithm that searches for possible frequent itemsets by transforming data into binary bit representation and adding data representing the combination of regulatory elements step by step,and then mining frequent itemsets by bit and calculation.In the process of data mining,the algorithm is optimized by pruning,preprocessing and frequent item set deletion.Because the recursive method used by traditional frequent itemset mining algorithms such as FP-Growth algorithm can't effectively parallelize a large number of data,the greatest advantage of this algorithm is that it facilitates the parallel computation of data and provides a new idea for improving the efficiency of frequent itemset mining.This paper uses OpenMP technology to achieve parallel acceleration of the algorithm,in order to verify the parallel feasibility of the algorithm.In addition,two parallel algorithms,i.e."Parallel Control Element" and "Parallel Promoter",are designed to achieve the best parallel effect by comparing the two parallel algorithms with the serial algorithm.In the process of implementation,the corresponding hardware devices are used to realize the application of Hyper-Threading technology,and the best parallel results under the current hardware environment are obtained through test.