| The SECS(Semiconductor Equipment Communication Standard)standardizes the communication method of each equipment management center in the process of semiconductor production.This technology can be used to calibrate the communication mode in the work content of the semiconductor package so that the SECS interface can be grafted into the MES system as a communication bridge,allowing each hardware to achieve a high degree of integration with the CIM system.In order to improve the production efficiency and reduce semiconductor test cost,the system,which is based on SECS standard serial communication,focus on improving the traditional single semiconductor or dual semiconductor test monitoring mode and achieving 16 groups or more muti-semiconductor parallel test monitoring.In this paper,the concept and foundation of intelligent algorithm for semiconductor defect detection are introduced and analyzed and a fault detection method for semiconductor production based on Bayesian network is presented.The Bayesian network is used as the fault prediction model,and the parameters and failure prediction in the production process are used as the nodes of Bayesian network.The relevant parameters of Bayesian network are learned through statistical methods and training data accumulated in the production process,and Bayesian network reasoning is used to realize fault prediction.At the same time,the semiconductor manufacturing fault detection based on image edge detection is presented.This paper presents an image edge detection algorithm based on improved ant colony algorithm,introduces the process and details of the algorithm,and applies the algorithm to detect the edge of semiconductor wafer to realize semiconductor defect detection.During semiconductor testing,the effective application of computer technology not only enable people to have a deeper understanding of semiconductor testing work,but can speed up the testing speed of semiconductors and improve the accuracy of test results. |
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