Research On Test Case Generation Algorithm Of Embedded Software Timing Sequence Test Based On Combination Test

With the continuous development of computer technology,embedded software exists more widely in people's lives,and gradually penetrates into various fields of national economic development.It is important to ensu re the reliability of embedded software.During the testing of embedded software,the timing characteristics of embedded software cannot be ignored.The timi ng characteristics of embedded software are expressed in the order of parameter input and the moment of parameter injection.This paper studies the real-time characteristics of embedded software parameter input time.At present,the testing of embedded software mainly focuses on covering the running state of the software,and there is little research on the generation algorithm of test cases for the input time of embedded software parameters.In the field of software testing,combinatorial testing is widely used to generate test cases with high coverage.In this paper,based on the combination test,the combination between the input time of the parameters is covered.Firstly,the input time space of embedded software is analyzed,and the method of equivalenc e class division and boundary value analysis is combined to complete the selection of parameter inp ut time.Then,the possible constraints in the input time of the parameters are analyzed.The input time constraints include independent event constraints an d related time constraints at the input time,and the CCTL method is used to describe the time cons traints.Finally,the particle swarm optimization algorithm and the genetic algorithm are used to cover the combinations existing between the input moments o f the parameters,and the constraints existing between the moments can be satisfied.Based on the combination of parameter values and coverage,this paper also studies the test case generation algorithm of joint coverage parameter values and moments.Firstly,using Cartesian product to jointly represent the value of the parameter and the time is proposed,and then the constraints between the value of the parameter,the input time of the parameter,and the value of the parameter and the input time are analyzed.Using the CCTL method to describe these three constraints,and finally using genetic algorithm and particle swarm algorithm respectively,set the covering force as 2,the combination of the value of the parameter,the combination of the input time of the parame ter and the value of the parameter and the input time The combination of is overwritten at the same time,and a joint coverage array is generated,and the joint coverage array can satisfy the existing constraints.Develop test case generation tools,use some existing components of the H-JTP platform,combine the developed test case generation tools and the complex embedded software high coverage test platform developed by the laboratory,build an electronic equipment high coverage automatic test system,To verify the high coverage of this algorithm in test case generation and comprehensiveness in combination coverage.