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Study On Mechanism And New Structures Of Reverse Blocking IGBT

Posted on:2020-07-07Degree:MasterType:Thesis
Country:ChinaCandidate:Q LiuFull Text:PDF
GTID:2428330596976202Subject:Microelectronics and Solid State Electronics
Abstract/Summary:PDF Full Text Request
The symmetric blocking ability allows reverse blocking insulated gate bipolar transistor?RB-IGBT?cut down the components,power loss and redundancy of application system,which can improve the energy efficiency and system reliability in application of the T-type and matrix converters.With a long drift region,the non punch through?NPT?IGBT can obtain a bidirectional blocking ability.However,the NPT IGBT has large on-state voltage drop(Von)and turn-off energy loss(Eoff).The field stop?FS?IGBT wins a superior Von-Eoff tradeoff,owing to the existence of N-buffer layer.The FS IGBT doesn't possess the bidirectional blocking ability nevertheless.In order to address above problems,this thesis will propose and investigate two RB-IGBT devices by simulations.1.A RB-IGBT with shorted collector field plate?SCFP?is proposed?SCFP FS RB-IGBT?.The novel device has three strcuture features:Shorted Collector Field Plate?SCFP?,discontinuous N2 layer;and highly doped N1 in emitter side.In the forward blocking process,the trenches make the depletion region expand laterally and vertically under the N1 layer and enhance the E-field in thr drift region,and shield the high E-field from the J1 junction?p-body/N1?,avoiding premature breakdown at J1.The device obtains a high forward breakdown voltage?BVF?.In the reverse blocking process,the SCFP helps the depletion boundary extend laterally and vertically between the discontinuous N2,which enhances the E-field in the drift region and avoids premature breakdown at J2.Finally,the E-field is stopped by the N1 together with trenches,a high reverse breakdown voltage?BVR?is obtained.High doping N1 plays a role as carrier storage layer to increase the carrier concentration and make carriers distribution more uniform.Thus the device gains a low Von.During turn-off process,the electrons are extracted by the low resistance channel formed below the N2 layer by the SCFP.Therefore,a low Eoff and a good Von-Eoff tradeoff are achieved.Eoff is reduced 49%and67.2%compared with those of BEFE FS RB-IGBT and NPT RB-IGBT,respectively.2.A RB-IGBT with a collector assisted trench gate?CAG?is proposed.It features a spilt gate and a high doping N1 layer in emitter side,and Collector Assisted trench Gate,?CAG?.In the forward conduction state,when a negative voltage is applied to the CAG,hole injection efficiency is enhanced.Moreover,N1 acts as carrier stored layer and stores the holes.Consequently,a low Von is obtained.In the forward blocking state,a positive voltage is applied to the CAG to attract electrons around the CAG,forming an equivalent N-buffer layer to stop E-field.Thus a high BVF is obtained.Compared with FS IGBT,the BVR of the CAG RB IGBT is not restricted by the high doping N-buffer in the reverse blocking state.In the turn-off process,the spilt gates shorten the turn-off delay.The voltage applied to CAG is switched to positive to form electrons accumulation layer in advance,forming a low resistance path for extraction electron,leading to a low Eoff.The simulation results show that the proposed RB-IGBT realize much smaller Von and Eoff than NPT RB-IGBT,Eoff is reduced 52%and 85%compared with those of SJ SCT RB-IGBT and BEFE RB-IGBT,respectively.
Keywords/Search Tags:RB-IGBT, forward breakdown voltage(BV_F), reverse breakdown voltage(BV_R), on-state voltage drop(Von), turn-off loss(Eoff)
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