Non-lable Super-resolution And Quantitative Phase Imaging

We first introduce a kind of chip scale lensless large-field non-labeled microscope imaging technology,which can automatically present the microscope image of growth or fusion of cell culture,known as lensless imaging,for cell culture experiments.This technology utilizes the recent widespread and inexpensive high-performance image sensor chips to provide a low-cost and automated microscope solution.Unlike the two major lensless microscopy methods,optical fluidic microscopy and digital in-line holographic microscopy,this new method is fully capable of handling cell culture or any sample which cells may be continuously connected.Our experiments show that this method can be applied to the imaging of color cell culture samples or directly to the imaging and tracking of cell growth in the incubator.Intelligent petri dishes based on this technology can significantly simplify and improve cell culture experiments and reduce the risk of human labor and pollution.Then we introduce the non-labeled diffraction phase microscope(DPM),which is a common path quantitative phase imaging(QPI)method that can significantly alleviate the noise problem.DPM combines several properties of the current QPI approach with a compact Maherzehnder interferometer.This compact configuration essentially cancels out most of the noise-generating mechanisms and is single-lens,which means that the acquisition speed is limited only by the speed of the camera used.This technique is also lossless and does not require the sample to be dyed or coated.This unique set of functions enables DPM systems to accurately monitor the dynamics of various nano-scale phenomena in a variety of environments.DPM systems can run in both transport and reflection modes to accommodate transparent and opaque samples,respectively.Therefore,DPM's current applications include measuring the dynamics of biological samples,semiconductor wet etching and photochemical etching processes,surface moisture and evaporation of water droplets,self-assembly of nanotubes,expansion and deformation of materials,and detection of defects in semiconductor wafers.Finally,the white light DPM averaged the background of most of the scattered spots,and also provided the possibility for spectral measurement.