Development Of Automatic Test Platform For Embedded System

Nowadays,the ubiquitous embedded system covers many fields,such as national defense,family,business,medical treatment,and so on.In most of these fields,one or more embedded systems are included in most of the products,and the product functions are realized by the cooperation between a number of embedded systems or a single embedded system.By using the hardware interface of embedded system,test cases can be injected into the embedded system under test,when testing the large and distributed systems with complex internal software and vario us external hardware interfaces,the test coverage can not be guaranteed,and the product will hide dangers,which affects the normal work of the product;at the same time,a single test node can not test every link of a complex system composed of multiple components.In view of the above problems,it is of great significance to develop a distributed embedded system automatic test platform which can automatically inject test case into the measured embedded system through hardware interface,receive the test result data and analyze it.This project comes from the research project.After the analysis of the requirements of the project,this topic puts forward the overall design scheme of the embedded system automatic test platform.The embedded system automatic test platform adopts distributed architecture,using the integrated integration capability of the H-JTP platform,the special automation test component,the general hardware interface component developed in this topic and the hardware card of physical interface are integrated to form a test node in the distributed test system.The test signal or state information can be injected into the measured embedded system and receive the returned test results,and the embedded system can be evaluated and fault location,and the automatic test of the embedded system can be realized.The part of the special automatic test component is composed of four components,it has the function of generating test cases automatically according to the requirement,modeling the embedded system to generate the correct result data,comparing the returned real result data with the expected correct result data,producing test conclusion and locating the fault.The general hardware interface component part mainly completes the parameter configuration and behavior control of the hardware card,so that the test case can be injected into the measured system through the hardware interface,and the test result data can also be received through the hardware interface.Finally,using the H-JTP platform to build a semi physical simulation embedded system.The system is used to verify the functions of the embedded system automatic test platform.All the functions of the platform are verified and meet the expected design requirements.