Research On Single Event Upset Test Method For Zynq

As a kind of All Programmable So C(APSo C),Xilinx Zynq not only has the advantage of high-performance and low-power based on ARM,but also takes the good use of customized design,variable connector and parallel calculation ability due to the integration of FPGA sources,which meets the trend of low-cost,fast development and mass-production for controller chip in the area of commercial small satellites on-board computer.And it's popular to use Zynq in space application research,like NASA etc.As the core point for its application in on-board computer is to ensure the component reliability in the complicated energetic particle radiation space environment,while the key problem is SEU,it is significant to research on SEU test for Zynq,to provide a basis for SEU fault analysis and protective design.As a result,we have research and verification on SEU test method design aiming at SEU sensitivity source in Zynq.At first,we investigate and analyze the current research situation for Zynq SEU test methods,then we propose the Zynq SEU test evaluation index,and analyze the resource configuration of Zynq to confirm the SEU fault mode for programmable logic resource and processing system.On the basis of analysis on current research situation,we decide to research on the SEU test method for programmable logic Block RAM(BRAM)?Flip-Flips(FF)and Cache resources.With the combination of these fault mode,we propose the reliability dynamic test method design for BRAM and FF,and finalize the effective SEU test method for Cache.Secondly,based on the Xilinx Zynq-7020,we realize the test methods for Zynq BRAM?FF and Cache.Based on the analysis and description the principle of BRAM and FF SEU,we complete the design and implementation of the measured resources,monitoring circuit and data processing control software.In addition,we finish the hardware configuration and software design for L1 and L2 Cache resources according their operation mechanism.Finally,based on the proposed Zynq SEU test method,we simulate SEU by fault injection to confirm its effectiveness,and verify the test methods coverage rate according to real on-board debug.And the validation results indicate that with the proposed Zynq SEU test methods we can effectively detect and calculate the SEU fault for BRAM?FF and Cache.