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Research And Development On The Automatic Detection Platform Based On Linear Array Scanning Of Transparent Substrate Etching Circuits

Posted on:2019-09-15Degree:MasterType:Thesis
Country:ChinaCandidate:F LiaoFull Text:PDF
GTID:2428330566486803Subject:Engineering
Abstract/Summary:PDF Full Text Request
With the advantages of high resolution,high brightness and low power consumption,the flat panel display device has been widely used in the display field,the etching line pattern of transparent substrates is the most important part in the production of flat panel display equipment,whose defect directly determines the performance of the flat panel display equipment.At present,the detection cost of the transparent substrate etching line is high.Compared with large enterprises,small and medium-sized businesses cannot afford to purchase these detecting devices.Consequently,the detection level of transparent substrates etching line has become the crux of domestic small and medium-sized flat panel display equipment manufacturing enterprises to improve the yield and the quality.To reduce the production cost of small and medium-sized enterprises in China and to improve the automation level of enterprises,based on the on-line defect detection theory of machine vision,the automatic detection system of transparent substrates etching line on the basis of line array scanning system is studies,and the research and development of the scanning platform of the etching line array of transparent substrates are completed.The main work of the thesis includes the following parts:(1)Based on the analysis of the detection of the etching lines of transparent substrates,the overall systematic framework of the automatic detection platform for transparent substrate etching line array is designed,and the whole hardware and software platform are designed based on three modules of image acquisition motion control and image processing.In order to improve the operation efficiency and working synergy of the platform,the software module is contrived through “five views” method as per corresponding designing principles.(2)According to the actual detection needs,a reasonable imaging system is built.Combined with the characteristics of linear array scanning system,a simple and easy method of optical machine tuning is adopted,then the images are denoised.The image segmentation algorithm and image mosaic algorithm based on the Halcon Vision software platform are proposed,which can quickly procure the images that satisfy the subsequent detection requirements.At last,the workflow of the acquisition module is designed,and the controlling program and software interface of the Image Acquisition module are compiled combined with hardware.(3)The motion controlling platform of the automatic detection platform for linear array scanning is set up,and the relationship between the motion speed and the precision of the acquired image is studied.The method which utilizes the delegation and the event mechanism in C#.NET to achieve the automatic matching between motion speed and line array camera line frequency is put forward,and this method can be used to adjust the motion speed while ensuring the accuracy of the acquired image.The workflow of the motion control module is designed in combination with the Image Acquisition module,and the controlling program and software interface are compiled.(4)On the basis of the design of software and hardware of the automatic detection platform,the function and the precision of the system are tested.The capacitive touch-screen ITO circuits are selected as the experimental target,and the automatic testing is carried out,which proves that the platform designed in this paper runs quickly and stably,and has high accuracy of the detection of circuits.
Keywords/Search Tags:Transparent Substrate, Etching Line, Automatic Optical Inspection, Linear Array Scanning
PDF Full Text Request
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