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Research On Large Current Test Device Of Low Voltage 100kA

Posted on:2021-02-07Degree:MasterType:Thesis
Country:ChinaCandidate:J P MoFull Text:PDF
GTID:2392330605450229Subject:Engineering
Abstract/Summary:PDF Full Text Request
In recent years,the breaking capacity of low-voltage switchgear has been continuously increasing.In order to ensure the safe and reliable operation of low-voltage switchgear in the field,it is of academic significance and practical value to carry out the research and development of experimental devices for the dynamic and thermal stability of low-voltage switchgear.Therefore,this thesis has researched and developed the low-voltage 100 kA large-current test device.The low-voltage 100 kA large-current test device developed in this thesis adopts the principle of LC oscillation circuit,charges the capacitor bank with charging power supply,and then the capacitor bank discharges through the series reactor to form the required discharge current,so as to examine the dynamic and thermal stability performance of low-voltage switchgear.At first,this thesis aimed at the characteristics and requirement of LC oscillation circuit,detailed elaborated the LC oscillating current principle,at the same time,also more detailed introduces the common low voltage switch electrical principle of dynamic and thermal stability,hence the development and design of LC oscillation circuit major current test apparatus,and parameter calculation and verification,map get discharge current waveform and voltage waveform figure.Second,for the test device,a control system including capacitor charging device control,energy release switch control and closing switch control was designed based on the single-chip microcomputer,and the relevant control program and the remote interface design of the control system were written.Among them,a capacitor charging circuit is designed to realize charging control of the capacitor through automatic and manual parallel design.Final,the charging circuit,discharge circuit and energy leakage circuit in the main circuit are verified by experiments.The above work completed the overall design of the low-voltage and large-current test device,and the actual test conditions were fully considered in the specific design process,so that the test system has a highly practical value.The control system with single chip microcomputer as the core improves the performance of the experiment and improves the precision and accuracy.
Keywords/Search Tags:Low voltage switch, LC oscillation circuit, Dynamic stability, Thermal stability
PDF Full Text Request
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