Low Frequency Noise Detection System Based On IGBT

IGBT is currently the most innovative power device which is widely used in wind power generation converter and aerospace control system and other fields,its reliability is directly related to the safe operation of the whole system,so its reliability assessment has become a hot topic.The low frequency noise in IGBT devices contains important information about its material and internal carrier microscopic motion,so it can be used to study internal defects in IGBT devices and to understand internal charge transfer mechanism.Low-frequency noise detection is a key task in establishing the connection between intrinsic phenomena and external performance,noise characteristics and reliability characterization of electronic devices.IGBT single tube is taken as the research object in this paper,and the IGBT low frequency noise detection system is designed to realize the non-destructive detection of IGBT low frequency noise based on the study of the statistical characteristics and physical characteristics of low frequency noise of IGBT.The specific work completed is as follows: 1).The theoretical basis of low-frequency noise of semiconductor devices,basic parameters of low-frequency noise detection and low-frequency noise detection technology was studied;the internal structural characteristics,working characteristics and small-signal equivalent circuit model of IGBT devices was analyzed,and IGBT device drain voltage noise model was established;the low frequency noise detection scheme for IGBT devices was determined.2)IGBT low frequency noise detection system was designed.It mainly includes two parts: hardware measurement system and software analysis platform.The hardware measurement system includes power supply system,low noise IGBT bias circuit,low noise preamplifier and high speed data acquisition card.It designs and analyzes each module.Noise characteristics and working characteristics;software analysis is a low-frequency noise analysis platform built in the LabVIEW programming environment.It mainly displays the low-frequency noise data time series and power spectral density display and analysis collected by high-speed data acquisition card and the storage of IGBT low-frequency noise data.And the printing of the test report;3).The JCS4N80 F IGBT single-tube normal device provided by Jilin Huawei Electronics Co.,Ltd.and the two types of devices after hightemperature reverse bias test are used as detection objects to detect the low-frequency noise time series and spectrum of the two types of devices respectively.The analysis of the time series and spectrum of the low frequency noise data is completed.The experimental results show that the detection system has good performance and can accurately acquire the low-frequency noise data of the IGBT device and complete its spectrum analysis function.Through the exploration and research of this subject,it will provide accurate and feasible methods and techniques for low-frequency noise detection of IGBT devices,and provide strong support for reliability characterization and fault diagnosis of IGBT devices.