| MCP as a high-performance two-dimensional electron multiplication device,with low noise,high gain and high resolution is used in various research fields such as night vision and space exploration.An X-ray detector based on large area MCP is an important component of pulsar navigation.Electronic scrubbing and performance testing are necessary steps in the preparation of large areas of MCP.This paper focused on the research of the electronic scrubbing and performance testing technology of large area MCP.Firstly,this paper introduced the development of MCP and the traditional two electronic sources for the MCP electronic scrubbing and performance testing.Secondly,according to the working principle of MCP and the requirements of large-area MCP electronic scrubbing and performance test,a new large-area uniform electron source was designed.The mechanism of MCP electronic scrubbing was analyzed theoretically.The closed loop automatic control scheme of MCP electronic scrubbing and the test method for characteristic parameters of MCP were proposed.Then,according to the proposed scheme,a multi-position large area MCP electronic scrubbing and performance testing device was designed.The control software of MCP scrubbing test system and MCP uniformity test software were witten,and the debugging between software and hardware has been completed.Finally,electronic scrubbing and performance testing experiment of 100mm×50mm large-area MCPs for pulsar navigation were carried out.The current gain characteristics of MCP and the influence of different input current on the gain are studied.The uniformity of MCP was tested,and the resistivity of MCP was analyzed before and after baking.The effects of electronic scrubbing on the MCP gain and dark count were studied.The results show that this device can not only carry on the high quality electronic scrubbing to the large area MCP,but also can carry on the performance testing to the scrubbed MCP,thus obtain the high quality large area MCP. |
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