Study On The Interference Characteristics Of The Logical Chip Due To Plasma Created By Strong Impact

To research damage characteristics of typical logical chip module in spacecraft due to plasma generated by strong impact.We have established Triple Langmuir probe diagnostic system and logical chips measurement system,which were used to diagnose plasma characteristic parameters and logical chip module's logical state changes due to plasma created by 7075 Aluminum projectile strong impact 2A12 Aluminum target.This paper has selected 3 kinds of logical chip which are widely used in spacecraft:CD54ACT32?CD74HC4075?SN54AHCT08.Under the condition of the incident angle is the same,only change the collision speed to analyze the plasma damage situation of the above 3 kinds of logical chips which is created by projectile strong impact aluminum target.The experimental results showed that:(a)The plasma can be created in the case of impact speed is more than 2.52km/s,but the plasma damage degree of each logical chips are not identical,the capacity of resisting disturbance of the CMOS logical chip 4075 is the best among 3 kinds of logical chips,the capacity of resisting disturbance of the CMOS logical chip is better than TTL logical chip's;(b)As the impact velocity increased,the density of plasma relationship to increase exponentially;(c)The state change of logical chips is lag than the plasma created by strong impacted,in the process of expansion,the plasma created by hypervelocity impact may attach together when meeting electron device,and when the charge after the accumulation reaches a certain extent after will have interference effect on logical circuit;(d)The damage of logical chips mainly for three forms due to the plasma created by changing strong impact,go down with transmission signal transient state break off and quickly recover,output logical relationship transience distortion and the damage of logical chips' pin.