Development Of Protable Integrated Test System Of Fuse

As one of the most critical subsystems of ammunition, fuse is very important. To ensure the reliability and terminal damage effect of ammunition, Fuses should have a good performance. As the evaluative ruler of fuse, The Integrated Test System has already become a indispensable part of fuse during the period of research, production and maintenance. With the improvement of variability and flexibility of modern warfare,the requirements of fuse in protection timeliness will be further enhanced. Under the premise of complete function, ATS of fuse should be portable, mobility and reliability. Therefore, it is very necessary to develop portable integrated test system of fuse.Based on the analysis of a series of fuse testing requirements, we design the portable Integrated Test System of fuse with reasonable hardware circuit and controlling software. The portable ATS is so versatile that it can be used for testing a series of fuses. The microcontroller chip of ATS is STM32F103ZET6, which is mainly used for controlling the testing process and dealing with the information of human-computer interaction. Around the microcontroller chip, the paper also completed the design of hardware circuit in action time testing module, resistance testing module, power supply module and other functional module. We also develop the software program based on modular method, The main program accomplishes the testing tasks by calling the various subroutines which include the self-test program, resistance measurement program, action time measurement program, results analysis program, data display program and digital phase-sensitive detection program etc.In order to improve the accuracy of low resistance testing under a small excitation current situation, Based on the theoretical analysis of error's sources we summarize the key issues which constrain the accuracy of resistance testing. And find out the corresponding solutions. For example, we use the current reversal technique to eliminate DC error, we also use the low offset, low drift amplifier to suppress offset voltage and drift, The resistance testing results show that the scheme can meet the basic needs of system design. In order to improve the accuracy further, we also studied on the lock-in amplifier. Firstly we set up two model of Lock-in amplifier in the Simulink environment to make a comparative verification. Secondly, we use the accumulated correlated and segmented algorithm to realize the digital phase-sensitive detector. Finally, we modify the existed hardware circuit to realize the modified lock-in amplifier. The testing result shows that the accuracy of low resistance testing can be improved significantly by using the lock-in amplifier low resistance testing scheme.