| The local surface plasmon(LSP) direct-writing lithography not only possesses the advantages of simple system structure, flexible lithography pattern, maskless, but more importantly, it can overcome the diffraction limit to reach the ultra-high lithography resolution. As the large-wavelength illumination incoming the nanolithography device based on the sub-wavelength apertures or probe, the LSP resonances would be excited.Taking advantages of the short-wavelength feature of the LSP, the sub-wavelength field distribution could be achieved at the tips of the probes or the edges of the aperture,which could be used for the sub-wavelength lithography. However, due to the exponential decay of evanescent wave components from the exit-plane of the aperture or probe, it requires the device and the photo-resist are contacted closely or separated by a few nanometers. This brings difficulties in accurate device positioning and avoiding photo-resist being scratched. Moreover, the rapid divergence of the light coming from the nano-scale structures inevitably delivers the hot spot with a shallow profile, which confines the development of the LSP direct-writing lithography.Aiming at these problems, through investigating the features of the LSP and its resonances, we proposed a new enhanced LSP nanolithography model which combines the bowtie aperture with metal-insulator-metal(MIM) scheme. Benefiting from this model, the plasmonic hot spot with higher resolution and stronger intensity was achieved. The main innovations of this article are listed below.1ã€We studied the enhanced transmission principles of the bowtie aperture and its influencing factors.2ã€A new enhanced LSP nanolithography model was proposed by combining the bowtie aperture with the metal-insulator-metal scheme. Numerical simulations show that the depth profile of the 28 nm FWHM plasmonic spot is more than 25 nm, which is about 4 times that of the bowtie aperture without the MIM scheme.3ã€Through the demonstration experiment, the smallest spot of 31 nm FWHM was achieved in photo-resist, demonstrating the advantages of the new structure. |