| VDDmin is defined as the lowest supply voltage at which a device can produce correct logic states. This kind of data can be obtained by performing a linear search on the power supply voltage. VDDmin test has been proved to be an effective method to screen out devices with manufacturing defects. It has become an important indicator of device performance and reliability given the fact that IDDQ test is not capable anymore to screen the defects in the products with 90nm or newer technology nodes.Monte Carlo simulation is a random sampling based computational methodology, which is widely used in finance, economy and a variety of engineering areas.This paper discusses a VDDmin distribution modeling method based on Monte Carlo simulation. Case study is enclosed to illustrate that this methodology is able to predict the yield impact due to the fab process variation. |
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