Research On Interoperable Testing Platform Based On Public Traffic Card

The public traffic one-card has already entered a mature stage via the development of Cards World in our country, based on the requirements of the new development and era of public transportation, public traffic one-card’s interoperability of the region or even whole country has become an important carrier of breakthrough administrative boundaries, promote intercity traffic integration and strengthen regional rapid capacity. There are some differences such as the terminal, IC card medium, chip standards, key systems around the various city, which become a major obstacle to interoperable work. So it resulted in the urgent need to build a platform to test the compatibility between the terminal, IC card and system to ensure the smooth operation of the interoperable work.This paper combines the logical structure of the ordinary traffic card system, research a card system based on the interoperable platform, analysis the key technology of the system about the design of platform architecture, integration and transition solution of IC card, reconstructive terminal system, key management and settlement system. On this basis, to build the interoperable testing platform of traffic card, to test the new line construction of public transport, terminal upgrades, product upgrades and other tests before use by the testing platform, the primary studying content is follows.(1) Design and realization of combined stress testing platform. Using the traditional software automation stress testing tool is difficult to effectively test the performance of its software and hardware due to the particularity trading data between the transforming of terminal, IC card and system, combination the requirements and analysis of combined stress testing under this three parts, put forward a software and hardware design scheme of the stress testing platform which is high efficiency and controllable parameters, to achieve the performance test between software and hardware of the terminal, IC card and system, at the same time, the test function is extended to the terminal error rate, the IC card read-write distance, flash cards and transaction time test. Experimental test data show that it better to achieve the design requirements of the combined stress testing platform.(2) Research of test scheme about resonant frequency testing platform. The resonant frequency is an important parameter to affect the consumption experience of IC card, this paper summed up the reason of the value is divergence and test misunderstanding of IC card resonant frequency based on the spectrum analyzer with the self-made fixture to collect different kinds of terminal and IC test data, combined with the IC card resonant principle, and confirm it by experimental simulation. At the same time, to explore a resonant frequency testing standards of the public traffic one-card’s interoperability through the statistical analysis of experimental data, to converge the value of resonant frequency on the condition of does not affect the users experience of IC card.(3) Design and realization of communicative protocol testing platform. Through the analysis of the communication parameters specified in the ISO/IEC 14443 protocol, combined with the present situation of testing technology of IC card, put forward design the communicative protocol testing platform with the IC card protocol analyzer and software radio technology, this platform includes interface and communication protocol testing function, and support the extended function of multi-protocol and customize testing standard. The experimental data show that the testing platform is better to complete the information collection of the communication protocol parameter of data, time, waveform and coding, and provides convenience for better distribution of the new compatibility IC card.The testing platform of development direction of this paper were prospected lastly, including the integrated construction of testing platform, optimized design of testing tools and expansion of testing function, and the more studying works of above bearing are expected.